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test.h

/***********************************************************************
*                                                                      *
*               This software is part of the ast package               *
*          Copyright (c) 1982-2009 AT&T Intellectual Property          *
*                      and is licensed under the                       *
*                  Common Public License, Version 1.0                  *
*                    by AT&T Intellectual Property                     *
*                                                                      *
*                A copy of the License is available at                 *
*            http://www.opensource.org/licenses/cpl1.0.txt             *
*         (with md5 checksum 059e8cd6165cb4c31e351f2b69388fd9)         *
*                                                                      *
*              Information and Software Systems Research               *
*                            AT&T Research                             *
*                           Florham Park NJ                            *
*                                                                      *
*                  David Korn <dgk@research.att.com>                   *
*                                                                      *
***********************************************************************/
#pragma prototyped
#ifndef TEST_ARITH
/*
 *    UNIX shell
 *    David Korn
 *    AT&T Labs
 *
 */

#include    "FEATURE/options"
#include    "shtable.h"
/*
 *  These are the valid test operators
 */

#define TEST_ARITH      040   /* arithmetic operators */
#define TEST_BINOP      0200  /* binary operator */
#define TEST_PATTERN    0100  /* turn off bit for pattern compares */

#define TEST_NE         (TEST_ARITH|9)
#define TEST_EQ         (TEST_ARITH|4)
#define TEST_GE         (TEST_ARITH|5)
#define TEST_GT         (TEST_ARITH|6)
#define TEST_LE         (TEST_ARITH|7)
#define TEST_LT         (TEST_ARITH|8)
#define TEST_OR         (TEST_BINOP|1)
#define TEST_AND  (TEST_BINOP|2)
#define TEST_SNE  (TEST_PATTERN|1)
#define TEST_SEQ  (TEST_PATTERN|14)
#define TEST_PNE  1
#define TEST_PEQ  14
#define TEST_EF         3
#define TEST_NT         10
#define TEST_OT         12
#define TEST_SLT  15
#define TEST_SGT  16
#define TEST_END  8
#define TEST_REP  20

extern int test_unop(int, const char*);
extern int test_inode(const char*, const char*);
extern int test_binop(int, const char*, const char*);

extern const char sh_opttest[];
extern const char test_opchars[];
extern const char e_argument[];
extern const char e_missing[];
extern const char e_badop[];
extern const char e_tstbegin[];
extern const char e_tstend[];

#endif /* TEST_ARITH */

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